Research and development efficiency measurement method and system based on machine learning

• Main Authors: CHEN YU, ZHANG XUE, TAO JIAJU
• Format: Patent
• Language: Chinese; English
• Published: 20.10.2023
• Subjects: CALCULATING; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS

The invention discloses a research and development efficiency measurement method and system based on machine learning. The method comprises the steps that firstly, research and development process data are obtained, the research and development process data comprise codes, documents, requirements, t...