Research and development efficiency measurement method and system based on machine learning

• Main Authors: CHEN YU, ZHANG XUE, TAO JIAJU
• Format: Patent
• Language: Chinese; English
• Published: 20.10.2023
• Subjects: CALCULATING; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS

The invention discloses a research and development efficiency measurement method and system based on machine learning. The method comprises the steps that firstly, research and development process data are obtained, the research and development process data comprise codes, documents, requirements, tests, defects and version control, then feature extraction based on statistics is carried out on the research and development process data to obtain a plurality of research and development process statistical features, the plurality of research and development process statistical characteristics comprise the number of code lines, the number of defects, the submission frequency and the code complexity, and then performing correlation analysis on the plurality of research and development process statistical characteristics by using a machine learning model to obtain a research and development efficiency measurement value. Therefore, efficiency index definition can be performed based on machine learning through data c