Mass spectrometer and method of measuring information about sample using mass spectrometer

The invention discloses a mass spectrometer and a method for measuring information about a sample using the mass spectrometer. A mass spectrometer includes an ion source, an ion trap, an ion detector, and an air pressure regulation system, where the air pressure regulation system is configured to ma...

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Bibliographic Details
Main Authors KNOPP KEVIN J, JOBIN MICHAEL, MILLER SCOTT, KRYLOV EVGENY, BROWN, CHRISTOPHER, D, BARTFAY-SZABO ANDREW J
Format Patent
LanguageChinese
English
Published 10.10.2023
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Summary:The invention discloses a mass spectrometer and a method for measuring information about a sample using the mass spectrometer. A mass spectrometer includes an ion source, an ion trap, an ion detector, and an air pressure regulation system, where the air pressure regulation system is configured to maintain an air pressure between 100 mTorr and 100 Torr in at least two of the ion source, the ion trap, and the ion detector during operation of the mass spectrometer, and the ion detector is configured to detect the ions according to a mass-to-charge ratio of the ions generated by the ion source. 本申请公开了质谱仪和使用质谱仪测量关于样品的信息的方法。质谱仪包括离子源、离子阱、离子检测器和气压调节系统,其中,在运行质谱仪期间,气压调节系统经配置在离子源、离子阱和离子检测器中的至少两个中维持在100mTorr与100Torr之间的气压,并且离子检测器经配置根据由离子源生成的离子的质荷比检测离子。
Bibliography:Application Number: CN202310656854