CAN bus interface digital X-ray thickness measuring sensor and method

• Main Authors: YANG MU, LI WEINENG
• Format: Patent
• Language: Chinese; English
• Published: 10.10.2023
• Subjects: ELECTRIC COMMUNICATION TECHNIQUE; ELECTRICITY; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING; TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION

The CAN bus interface digital X-ray thickness measuring sensor comprises a small shielding aluminum cylinder and a large shielding aluminum cylinder which are connected into a whole, a protective net cover is arranged on the lower end face of the small shielding aluminum cylinder, an ionization chamber is arranged in a cavity of the small shielding aluminum cylinder, an insulating washer is arranged between the ionization chamber and the protective net cover, and the insulating washer is connected with the small shielding aluminum cylinder through a wire. The upper end portion of the ionization chamber is connected with an insulation pressing ring, an annular PCB is arranged in the large shielding aluminum cylinder and located above the insulation pressing ring, and the upper end of the large shielding aluminum cylinder is connected with an upper cover. Based on the preprocessing capability of the single-chip microcomputer, the primary sampling rate of 4.2 kHz can be realized, and the defect of low acquisitio