Chip communication test method and device, electronic equipment and storage medium

The invention provides a chip communication test method and device, electronic equipment and a storage medium, and the method comprises the steps: responding to a target setting instruction added on a protocol event interface, and loading a field setting interface corresponding to the target setting...

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Bibliographic Details
Main Authors LIU XIANG, ZHOU HAO, LEI LONG
Format Patent
LanguageChinese
English
Published 19.09.2023
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:The invention provides a chip communication test method and device, electronic equipment and a storage medium, and the method comprises the steps: responding to a target setting instruction added on a protocol event interface, and loading a field setting interface corresponding to the target setting instruction; a test item field and a test result field corresponding to the target setting instruction are displayed on the field setting interface; responding to a target communication protocol and a configuration format selected on the field setting interface, and converting test item information added at a test item field according to the configuration format to generate target test data; and sending the target test data to a test machine based on the target communication protocol, obtaining a test result of the to-be-tested chip generated by the test machine, converting the test result, and filling the test result field with the converted test result. The test efficiency of the chip is improved, data between d
Bibliography:Application Number: CN202310769297