Glass substrate surface defect detection method and device

• Main Authors: ZHENG CONG, REN HONGCAN, CHEN YING, PENG SHOU, WANG GUOQUAN, LI ZHAOTING, ZHANG CHONG
• Format: Patent
• Language: Chinese; English
• Published: 08.09.2023
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention relates to the technical field of panel detection, in particular to a glass substrate surface defect detection method and device, and the method comprises the following steps: S1, placing a glass substrate according to requirements, and configuring an imaging module; s2, acquiring image information of the whole glass substrate; and S3, analyzing the image information of the whole glass substrate and judging the position of the defect. The step S3 further comprises the following steps: S3.1, extracting defect characteristic values based on the image information of the whole glass substrate; and S3.2, comparing the characteristic values of the defect image and judging the position of the defect based on the comparison result. Compared with the prior art, higher detection efficiency can be generated with lower configuration cost. 本发明涉及面板检测技术领域，具体涉及一种玻璃基板表面缺陷检测方法及装置，包括如下步骤：S1：按要求放置玻璃基板并配置好成像模块；S2：获取玻璃基板整板图像信息；S3：分析玻璃基板整板图像信息并判断缺陷所处位置。步骤S3还包括如下步骤：S3.1：基于所述玻璃基板整板图像信息提取缺陷特征值；S3.2：比较缺陷图像的特征值并基于比较结果判断缺陷所