Defect detection method and device, computer equipment and storage medium

• Main Authors: XIAO ZHIHONG, ZHENG BO, XIE ZHUOGANG, WANG QIAN, MA ZEXIONG
• Format: Patent
• Language: Chinese; English
• Published: 05.09.2023
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention relates to a defect detection method and device, computer equipment and a storage medium. The method comprises the following steps: acquiring an object graph collected for a to-be-detected object; the object to be detected is placed on the rotating platform; performing defect identification on a contour region in the object image; if the contour area suspected to have the defect is identified, controlling the rotating platform to rotate, and acquiring an object graph recollected for the to-be-detected object at an angle after rotation; according to the rotation angle of the rotation platform, determining the corresponding mapping position of the position of the contour area with the suspected defect in the re-collected object graph; and carrying out defect identification on the contour region at the mapping position in the re-collected object image. By adopting the method, the accuracy of defect detection can be improved. 本申请涉及一种缺陷检测方法、装置、计算机设备和存储介质。所述方法包括：获取针对待检测对象采集的对象图；所述待检测对象放置在旋转平台上；对所述对象图中