Method for determining minimum film thickness of intermediate coating

• Main Authors: XIONG FEN, WANG RANRAN, WU JUNXIONG, LAN WEI, CHEN LIN
• Format: Patent
• Language: Chinese; English
• Published: 29.08.2023
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention discloses a method for determining the minimum film thickness of an intermediate coating, and relates to the technical field of coating thickness determination.The method comprises the steps that paint film samples with different intermediate coating film thicknesses are manufactured, and the transmittance of ultraviolet visible light of each paint film sample at a preset wave band is measured; obtaining the transmittance of a set wavelength and the average transmittance of each wavelength interval; respectively obtaining the transmittance of the set wavelength and the average value of each average transmittance under each paint film sample, constructing an intermediate coating film thickness model, and obtaining model parameters; according to the maximum limit of the transmittance of the set wavelength, the maximum limit of the transmittance of each wavelength interval and the model parameters, the set wavelength and the minimum film thickness corresponding to each wavelength interval are obtai