Test method for detecting open circuit and short circuit of array test point

• Main Authors: WEI SHANLEI, GU ZHAOYONG, WENG TIANLI, TANG CHAOYANG, SEO HWAN-HA, TANG CHAOLIANG
• Format: Patent
• Language: Chinese; English
• Published: 22.08.2023
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention provides a test method for detecting open circuit and short circuit of array test points, which comprises a POWER1 power supply, a SWITCH1 switching module, an R1 resistor, an MCU1 master control module, a POWER2 power supply, a SWITCH2 switching module, an R2 resistor, an MCU2 master control module, a PCB (printed circuit board) 1 and a PCB 2, the PCB 1 and the PCB 2 are provided with a plurality of to-be-tested points with corresponding positions, the POWER1 power supply is used for supplying power to the SWITCH1 switching module, the R1 resistor is used for supplying power to the MCU1 master control module, and the R2 resistor is used for supplying power to the MCU2 master control module. The SWITCH 1 switching module is connected with a point to be tested on the PCB 1 through a resistor R1, the point to be tested on the PCB 1 and a point to be tested on the PCB 2 form a loop through a probe, the MCU1 master control module controls the SWITCH 1 switching module to perform high and low level s