Refractive index type MOF-SPR probe with external indium tin oxide double nanowires

• Main Authors: LIU WEI, LIU QIANG, WANG JIANXIN, LIU MEIQI, LUO XINGDI, MENG TONGYU, HE JIE, LIU CHAO, LYU JINGWEI
• Format: Patent
• Language: Chinese; English
• Published: 22.08.2023
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS; OPTICS; PHYSICS; TESTING

The invention relates to an optical fiber probe, in particular to a refractive index type MOF-SPR probe with external indium tin oxide double nanowires, the MOF-SPR probe is composed of a microstructure optical fiber and two indium tin oxide nanowires, a cladding of the microstructure optical fiber is internally provided with a central air hole and four symmetrical elliptical air holes, two sides of the cladding are provided with D-shaped notches, and the two indium tin oxide nanowires are arranged in the central air hole. The two indium tin oxide nanowires are located on the two sides of the D-shaped notch and tangent to the midpoint of the D-shaped notch, and fiber cores of the microstructure optical fiber are located on the upper side and the lower side of the center air hole and between the two oval air holes, so that the microstructure optical fiber with the two symmetrical cores is formed. The radius of the cladding is 16mm; the radius of the central air hole is 0.8 mm; the radius of the indium tin oxid