Calibrating electronic components during production process

• Main Authors: RIJSKAMP THOMAS, LOEBACH MICHAEL, BRONNER JESPER, FISCHER PEER, WABROUGH LESLIE, WECKERT ROBERT, GRIESBACH GREGOR
• Format: Patent
• Language: Chinese; English
• Published: 04.08.2023
• Subjects: ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS; MEASURING; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR; PHYSICS; TARIFF METERING APPARATUS; TESTING

The electronic component is calibrated during the production process. The invention relates to a method for calibrating an electronic component during a production process (40), comprising the following steps:-determining (S1) a calibration value (44) for the component (41), said calibration value indicating a deviation between an actual output value output by the component (41) and a predefined desired output value in the case of a predefined input value,-transmitting (S2) the calibration value (44) to the component (41), and storing (S3) the calibration value (44) in the component (41), the calibration value (44) of the component (41) being determined by means of a machine learning method (42) executed in a calibration device (47), and the machine learning method (42) being trained by means of training data, the training data includes historical calibration values (32) of a plurality of components of the same type and parameters (34) of components of the same type that are dependent on production and/or tha