Nondestructive identification method, device and equipment for internal defects of kiwi fruits and storage medium
The invention belongs to the technical field of quality detection, and discloses a lossless identification method and device for internal defects of kiwi fruits, equipment and a storage medium. The method comprises the following steps: scanning a sample kiwi fruit to obtain an original scanning imag...
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Main Authors | , , , , , |
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Format | Patent |
Language | Chinese English |
Published |
01.08.2023
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Subjects | |
Online Access | Get full text |
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Summary: | The invention belongs to the technical field of quality detection, and discloses a lossless identification method and device for internal defects of kiwi fruits, equipment and a storage medium. The method comprises the following steps: scanning a sample kiwi fruit to obtain an original scanning image; obtaining defect feature information according to the original scanning image; determining a defect evaluation data set according to the defect feature information; constructing a classification model according to the defect evaluation data set; the defect volume ratio of the kiwi fruits to be classified is obtained through the classification model; and performing defect quantitative grading on the kiwi fruits to be classified according to the defect volume ratio. By means of the mode, automatic analysis is conducted on the follow-up kiwi fruits needing defect recognition and classification on the basis of scanning of the sample kiwi fruits and in the mode of constructing the classification model, quantitative c |
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Bibliography: | Application Number: CN202310384510 |