Memory bad block scanning method and circuit system thereof

• Main Author: SEO BO-KYUNG
• Format: Patent
• Language: Chinese; English
• Published: 11.07.2023
• Subjects: INFORMATION STORAGE; PHYSICS; STATIC STORES

The invention relates to a memory bad block scanning method and a circuit system thereof, in a program for scanning memory bad blocks, the circuit system uses a cache reading instruction, the cache reading instruction is suitable for a program for continuously reading memory pages of a memory, and the memory page data of the memory can be loaded into a cache in advance. The data is read in the next instruction period, then the next storage page data is loaded into the high-speed cache, and the operation is cyclically executed until the program for scanning the bad block of the memory is completed, so that the time for the memory to prepare the next data can be effectively shortened in the process, and the influence of busy time read by the memory on the aging is reduced. 一种存储器坏块扫描方法及其电路系统，在执行扫描存储器坏块的程序中，电路系统使用一高速缓存读取指令，高速缓存读取指令适用在连续读取存储器存储页的程序中，能够预先将存储器的存储页数据载入到一高速缓存中，在下一个指令周期再将数据读出，接着载入下一笔存储页数据至高速缓存，如此循环执行直到完成扫描存储器坏块的程序为止，过程中可以有效减少存储器准备下一笔数据的时间，降低存储器读取忙碌时间对时效的影响。