Laser flatness measuring instrument and working method thereof

• Main Authors: JIN ZHONGYI, GU CHUNJING, KWAK SEONG-HO
• Format: Patent
• Language: Chinese; English
• Published: 04.07.2023
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

The invention relates to a laser flatness measuring instrument and a working method thereof, and the measuring instrument comprises a pair of laser assemblies which are symmetrically fixed on a base frame at an interval, each laser assembly generates a plane laser during working, and the included angle between each plane laser and a measured plane is the same; planar laser output by each laser assembly is projected on a measured plane to form two light rays; if the measured plane is an ideal reference plane, the two light rays coincide; the photoelectric recognition and operation device obtains images of the central sections of the two light rays so as to recognize the distance between the two light rays; and according to the distance and the included angle, parameters of the pit or the bulge on the measured plane are obtained. And when the two laser lines are separated and the laser lines and the light sources of the laser lines are on the same side, the projection is formed. And when the two laser lines are