Groove type silicon carbide MOSFET device and preparation process thereof

The invention provides a trench type silicon carbide MOSFET device and a preparation process thereof, the MOSFET device comprises a high-concentration N-type drain electrode and drain electrode metal, a low-concentration N-type epitaxial layer is arranged on the high-concentration N-type drain elect...

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Main Authors ZHU CHENKAI, ZHU YUANZHENG, YANG ZHUO, HUANG XUEQUAN
Format Patent
LanguageChinese
English
Published 27.06.2023
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Abstract The invention provides a trench type silicon carbide MOSFET device and a preparation process thereof, the MOSFET device comprises a high-concentration N-type drain electrode and drain electrode metal, a low-concentration N-type epitaxial layer is arranged on the high-concentration N-type drain electrode, a P-type well region is arranged above the N-type epitaxial layer, a high-concentration N-type source electrode and a high-concentration P-type source electrode are arranged on the surface of the P-type well region, and the high-concentration N-type source electrode and the high-concentration P-type source electrode are arranged on the surface of the P-type well region. A longitudinal groove is formed in the surface of the end, away from the high-concentration N-type drain electrode, of the N-type epitaxial layer, polycrystalline silicon is arranged in the longitudinal groove, the periphery of the polycrystalline silicon is wrapped by a gate oxide layer, a P-type doped region is further arranged in the N-type
AbstractList The invention provides a trench type silicon carbide MOSFET device and a preparation process thereof, the MOSFET device comprises a high-concentration N-type drain electrode and drain electrode metal, a low-concentration N-type epitaxial layer is arranged on the high-concentration N-type drain electrode, a P-type well region is arranged above the N-type epitaxial layer, a high-concentration N-type source electrode and a high-concentration P-type source electrode are arranged on the surface of the P-type well region, and the high-concentration N-type source electrode and the high-concentration P-type source electrode are arranged on the surface of the P-type well region. A longitudinal groove is formed in the surface of the end, away from the high-concentration N-type drain electrode, of the N-type epitaxial layer, polycrystalline silicon is arranged in the longitudinal groove, the periphery of the polycrystalline silicon is wrapped by a gate oxide layer, a P-type doped region is further arranged in the N-type
Author ZHU CHENKAI
YANG ZHUO
ZHU YUANZHENG
HUANG XUEQUAN
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DocumentTitleAlternate 一种沟槽型碳化硅MOSFET器件及其制备工艺
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Snippet The invention provides a trench type silicon carbide MOSFET device and a preparation process thereof, the MOSFET device comprises a high-concentration N-type...
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SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
Title Groove type silicon carbide MOSFET device and preparation process thereof
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