Mirror surface defect detection method, system and equipment based on structured light and storage medium

• Main Authors: LIU TING, LU DIWEN, ZOU XUZHU, LIU SHUWEN, LI SIQING, ZHANG JUN
• Format: Patent
• Language: Chinese; English
• Published: 23.06.2023
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention discloses a structured light-based mirror surface defect detection method, system and device, and a storage medium. The method comprises the following steps: acquiring a real fringe pattern of a to-be-detected mirror surface; calculating the pixel brightness of the real fringe pattern, and according to the pixel brightness of the real fringe pattern, adopting a four-step phase shift method to obtain the background brightness, the reflectivity or the transmissivity and the phase of the to-be-measured mirror surface; calculating three-dimensional data of the to-be-measured mirror surface according to the obtained multiple measurement data of the to-be-measured mirror surface; and according to the background brightness, the reflectivity or the transmissivity, the phase and the three-dimensional data of the to-be-detected mirror surface, detecting to obtain the defect of the to-be-detected mirror surface. According to the invention, the mirror surface defect detection precision can be improved, and