Mirror surface defect detection method, system and equipment based on structured light and storage medium
The invention discloses a structured light-based mirror surface defect detection method, system and device, and a storage medium. The method comprises the following steps: acquiring a real fringe pattern of a to-be-detected mirror surface; calculating the pixel brightness of the real fringe pattern,...
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Main Authors | , , , , , |
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Format | Patent |
Language | Chinese English |
Published |
23.06.2023
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Subjects | |
Online Access | Get full text |
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Summary: | The invention discloses a structured light-based mirror surface defect detection method, system and device, and a storage medium. The method comprises the following steps: acquiring a real fringe pattern of a to-be-detected mirror surface; calculating the pixel brightness of the real fringe pattern, and according to the pixel brightness of the real fringe pattern, adopting a four-step phase shift method to obtain the background brightness, the reflectivity or the transmissivity and the phase of the to-be-measured mirror surface; calculating three-dimensional data of the to-be-measured mirror surface according to the obtained multiple measurement data of the to-be-measured mirror surface; and according to the background brightness, the reflectivity or the transmissivity, the phase and the three-dimensional data of the to-be-detected mirror surface, detecting to obtain the defect of the to-be-detected mirror surface. According to the invention, the mirror surface defect detection precision can be improved, and |
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Bibliography: | Application Number: CN202310119666 |