Rock sample longitudinal and transverse wave measuring probe structure

• Main Authors: WANG YONGHAO, RU CONG, WU ZHENPENG, XIA JIGEN, ZHAI YUWEN, DONG XINGMENG
• Format: Patent
• Language: Chinese; English
• Published: 13.06.2023
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention discloses a rock sample longitudinal and transverse wave measuring probe structure which comprises a base body and a probe shell which are installed together, a longitudinal wave wafer and a transverse wave wafer are installed in a gap between the base body and the probe shell, the longitudinal wave wafer is annular, the transverse wave wafer formed by splicing four quarter circular wafers is arranged in the annular shape, and after a drainage tube penetrates through the probe shell, the longitudinal wave wafer and the transverse wave wafer are arranged in the annular shape. The longitudinal wave wafer and the transverse wave wafer penetrate through the transverse wave wafer and extend to the pressure bearing face of the base body, and wires of the longitudinal wave wafer and the transverse wave wafer penetrate through a gap between the probe shell and the drainage tube. According to the probe structure disclosed by the invention, the longitudinal wave probe and the transverse wave probe are int