Relative intensity noise characteristic measuring device and method with extremely low background noise

• Main Authors: YU YIHANG, YANG FEI
• Format: Patent
• Language: Chinese; English
• Published: 30.05.2023
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention relates to a relative intensity noise characteristic measuring device and method for extremely low background noise, which adopts a high-saturation photoelectric detector and low thermal noise spectrum analysis to realize-171dBc/Hz measurement background, greatly improves the performance of a test system, solves the interference of a frequency influence curve on a measurement result in an extremely low background noise test environment, and improves the measurement accuracy. And the original frequency response fluctuation of +/-2dB of the system is reduced to +/-0.7 dB through data processing, so that the interference of the frequency response of the system on a measurement result is further reduced. 一种极低本底噪声的相对强度噪声特性测量装置和方法，采用高饱和光电探测器和低热噪声谱分析实现-171dBc/Hz的测量本底，极大地提升了测试系统的性能，解决极低本底噪声测试环境下频率影响曲线对测量结果的干扰，将系统原本±2dB的频率响应波动通过数据处理降低至±0.7dB，进一步降低系统频率响应对测量结果的干扰。