Intelligent inspection method, device, equipment and medium

• Main Authors: CHEN QIUBIN, WANG YIXIN, WEI SHANGYANG, ZENG JUNMING, MA HAOZHENG
• Format: Patent
• Language: Chinese; English
• Published: 23.05.2023
• Subjects: ARRANGEMENTS, SYSTEMS OR APPARATUS FOR CHECKING NOT PROVIDEDFOR ELSEWHERE; CHECKING-DEVICES; GENERATING RANDOM NUMBERS; PHYSICS; REGISTERING OR INDICATING THE WORKING OF MACHINES; TIME OR ATTENDANCE REGISTERS; VOTING OR LOTTERY APPARATUS

The invention discloses an intelligent inspection method, device and equipment and a medium, and relates to the technical field of data processing. Comprising the following steps: sorting original inspection point locations in at least one candidate inspection task according to at least one of task execution starting time of the candidate inspection task, an inspection scene and a fixed polling sequence of the original inspection point locations to obtain a candidate inspection point location set; determining a target inspection point location of the target inspection task from the candidate inspection point location set according to the current time and the task execution starting time of the candidate inspection task; and sending an inspection execution instruction to a target execution machine corresponding to the target inspection point location, so that the target execution machine inspects the target inspection point location based on the inspection execution instruction, and feeding back an inspection