Model measurement method based on extended Lustre language

The invention relates to a model measurement method based on an extended Lustre language, and belongs to the field of software measurement. According to the method, the model structure tree is designed according to the extended Lustre language, and the model structure tree corresponding to the proje...

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Bibliographic Details
Main Authors WANG LEI, YASUTSUNE, ZHANG XIAOXIAO, ZHANG JIANWEI, JIA ZHANGTAO, SHAO SA, KONG XIANGBING, LI YASI, TAO JINLONG, JIN YUCHUAN, LI HAOYU, FENG DACHENG, WANG YUNZE, PANG HAOMING
Format Patent
LanguageChinese
English
Published 23.05.2023
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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