Group testing device and group testing method for multiple radio frequency chip modules

• Main Authors: HAYASHI AKIKAZU, QIU ZHIWEI, LIU RENWEI, ZHOU XIZENG
• Format: Patent
• Language: Chinese; English
• Published: 23.05.2023
• Subjects: ELECTRIC COMMUNICATION TECHNIQUE; ELECTRICITY; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING; TRANSMISSION

The invention discloses a group testing device and a group testing method for a plurality of radio frequency chip modules. The group testing device comprises a signal analyzer, a power divider, a plurality of control integrated circuits, a signal controller and a power combiner which are connected with one another, the power divider receives a radio frequency signal and transmits a plurality of radio frequency input signals to the radio frequency chip module and the control integrated circuit according to the radio frequency signal. The signal controller controls each control integrated circuit to adjust at least one of the power and the phase of the corresponding radio frequency input signal so as to generate a radio frequency output signal. The power combiner receives a radio frequency output signal from each control integrated circuit to generate a test signal. The signal analyzer receives the test signal and obtains the corresponding radio frequency characteristic according to at least one of the power an