Automatic calibration system and method for data acquisition device of bench test equipment

• Main Authors: GOU XIAOJUN, ZHANG GENG, CHEN XINFENG, WANG LIANFEI, LI MINGBO
• Format: Patent
• Language: Chinese; English
• Published: 16.05.2023
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention provides an automatic calibration system and method for a data acquisition device of bench test equipment. The system comprises a control unit (20), an automatic switching unit (30) and a standard signal source (40), and the control unit (20) is used for controlling an automatic calibration process. An automatic calibration process comprises performing, for each channel of a data acquisition device (10) and for each calibration term of each channel, a calibration operation that an automatic switching unit (30) causes a particular channel of the data acquisition device (10) to contact a standard signal source (40) based on channel information and calibration term information received from a control unit (20), respectively the specific calibration item is connected; the control unit (20) then receives a standard value corresponding to the specific calibration term from the standard signal source (40) and an actual value acquired by the data acquisition device (10) from the data acquisition device