Automatic calibration system and method for data acquisition device of bench test equipment

The invention provides an automatic calibration system and method for a data acquisition device of bench test equipment. The system comprises a control unit (20), an automatic switching unit (30) and a standard signal source (40), and the control unit (20) is used for controlling an automatic calibr...

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Bibliographic Details
Main Authors GOU XIAOJUN, ZHANG GENG, CHEN XINFENG, WANG LIANFEI, LI MINGBO
Format Patent
LanguageChinese
English
Published 16.05.2023
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:The invention provides an automatic calibration system and method for a data acquisition device of bench test equipment. The system comprises a control unit (20), an automatic switching unit (30) and a standard signal source (40), and the control unit (20) is used for controlling an automatic calibration process. An automatic calibration process comprises performing, for each channel of a data acquisition device (10) and for each calibration term of each channel, a calibration operation that an automatic switching unit (30) causes a particular channel of the data acquisition device (10) to contact a standard signal source (40) based on channel information and calibration term information received from a control unit (20), respectively the specific calibration item is connected; the control unit (20) then receives a standard value corresponding to the specific calibration term from the standard signal source (40) and an actual value acquired by the data acquisition device (10) from the data acquisition device
Bibliography:Application Number: CN202111345663