Image analysis method and device

• Main Authors: JIA YUANJUN, ZHANG JIAN, MU ZHENHUA, LUO JIANTAO
• Format: Patent
• Language: Chinese; English
• Published: 05.05.2023
• Subjects: CALCULATING; COMPUTING; COUNTING; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; PHYSICS

The invention relates to the technical field of image analysis, and provides an image analysis method and device. The method comprises the following steps: acquiring an original image containing a to-be-recognized target; importing the original image into a preset identification model, and identifying a target rectangular area; cutting out a target sub-image from the original image based on the target rectangular region; performing multi-resolution curvelet transformation on the target sub-image to generate a target feature vector; and comparing the target feature vector with a preset template feature vector, and judging whether the to-be-recognized target in the original image is abnormal or not. According to the embodiment of the invention, the state of the insulator can be synchronously determined on the whole and in details, so that the accuracy and effectiveness of an analysis result are greatly improved. 本公开涉及图像分析技术领域，提供了图像分析方法及装置。该方法包括：获取包含待识别目标的原始图像；将所述原始图像导入预设的识别模型，识别出目标矩形区域；基于所述目标矩形区域从所述原始图像中剪切出目标子图