Data writing method and system and data reading method and system based on bad blocks
The invention provides a bad block-based data writing method, a bad block-based data reading method and a bad block-based data writing system, and the bad block-based data writing method comprises the following steps: filling a version number and a serial number corresponding to to-be-written data a...
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Main Authors | , , , |
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Format | Patent |
Language | Chinese English |
Published |
02.05.2023
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Subjects | |
Online Access | Get full text |
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Summary: | The invention provides a bad block-based data writing method, a bad block-based data reading method and a bad block-based data writing system, and the bad block-based data writing method comprises the following steps: filling a version number and a serial number corresponding to to-be-written data according to a preset data writing rule, and storing the to-be-written data; obtaining a check code CRCA of the to-be-written data, and storing the check code in a cache of an MCU (Microprogrammed Control Unit); reading back the data to be written, and checking the data to be written according to the check code and the data writing rule; and if the verification is passed, completing data writing. And after the data is written, the written data is checked according to the check code and the data writing rule, so that the data writing is safer.
本申请提供了基于坏块的数据的写入方法、读取方法及其系统,包括:根据预设的数据写入规则,填充与待写入数据对应的版本号和序列号,并保存所述待写入数据;获取所述待写入数据的校验码CRC_A,并将所述校验码保存到MCU的缓存中;回读所述待写入数据,根据所述校验码和所述数据写入规则对所述待写入数据进行校验;如果所述校验通过,则完成数据写入。在数据写入之后根据校 |
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Bibliography: | Application Number: CN202211732195 |