Plate-shaped connector, double-arm serial connection piece thereof and wafer test assembly

• Main Authors: LIU ZHAOQIANG, ZHENG MENGJIE, XIE KAIJIE, SU WEIZHI
• Format: Patent
• Language: Chinese; English
• Published: 07.04.2023
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention discloses a plate-shaped connector, a double-arm serial connection piece thereof and a wafer test assembly. The plate-shaped connector comprises a plurality of double-arm serial connection pieces which are arranged at intervals and an insulating layer. Each double-arm serial connection piece comprises a bearing body, a first cantilever, a second cantilever, a first abutting column and a second abutting column, wherein the first cantilever and the second cantilever extend from the bearing body and are arranged in a coplanar mode, and the first abutting column and the second abutting column extend from the first cantilever and the second cantilever in opposite directions respectively. The insulating layer is connected with the bearing bodies of the plurality of double-arm type serial connection pieces, and the first abutting column and the second abutting column of each double-arm type serial connection piece protrude out of the two opposite sides of the insulating layer respectively. And each dou