Ion implanter system equipment of bent rear scanning electrode and ion implantation method
An ion implanter system device and an ion implantation method, the ion implanter system device comprising: an ion beam generator for generating an ion beam; the scanning system is used for receiving the ion beam and generating a scanned beam; and an electrode receiving the scanned beam. At least a p...
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Main Authors | , , , |
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Format | Patent |
Language | Chinese English |
Published |
04.04.2023
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Subjects | |
Online Access | Get full text |
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Summary: | An ion implanter system device and an ion implantation method, the ion implanter system device comprising: an ion beam generator for generating an ion beam; the scanning system is used for receiving the ion beam and generating a scanned beam; and an electrode receiving the scanned beam. At least a portion of the electrode is perpendicular to a propagation direction of the scanned beam. The portion of the electrode perpendicular to the propagation direction of the scanned beam may have a curved shape. By using a post-scan electrode having a shape (e.g., a curved shape) perpendicular to the fan beam envelope propagation direction, refractive displacement of an apparent scan origin relative to the scan origin can be advantageously avoided. The use of post-scan electrodes having a curved shape or an arc shape enables the use of significantly higher voltages on the scan plate and post-scan electrodes than those used in conventional scanning systems.
一种离子植入机系统设备及离子植入方法,所述离子植入机系统设备包括离子束产生器,产生离子束;扫描系统,接收所述离子束并产生经扫描束; |
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Bibliography: | Application Number: CN202310097928 |