Quantitative evaluation method and device for primary banded structure

• Main Authors: YAN CHUNLIAN, MENG YANG, JU XINHUA, WEN JUAN
• Format: Patent
• Language: Chinese; English
• Published: 31.03.2023
• Subjects: CALCULATING; COMPUTING; COUNTING; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention discloses a quantitative evaluation method and device for a primary banded structure, and the evaluation method comprises the steps: carrying out the electronic probe scanning of a to-be-evaluated target region on a rolled metal sample, obtaining a scanning matrix representing the content of a target element, processing the scanning matrix into a binary image of the target region, and carrying out the quantitative evaluation of the primary banded structure. The method comprises the following steps: representing morphological distribution of a primary banded structure through a binary image, dividing grid measurement lines for the binary image along the parallel direction and the vertical direction of a rolled metal sample, obtaining characteristic statistical data in the parallel direction and the vertical direction based on a preset intercept point method, and evaluating the severity of the primary banded structure of a target area based on the characteristic statistical data. The overall evalu