Bytecode-based test workload evaluation method and device, and medium

• Main Authors: PAN XINGCHENG, TIE JINCHENG, CHEN WENGUANG, NI JIALE
• Format: Patent
• Language: Chinese; English
• Published: 28.03.2023
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS

The invention relates to a bytecode-based test workload evaluation method and device and a medium, and the method comprises the following steps: carrying out bytecode analysis on a test item class file to obtain a calling relation among an interface, a function and configuration, and constructing a calling relation graph according to the calling relation; comparing each function instruction set in the class file of the current version with each function instruction set in the class file of the historical version to obtain code modification information; obtaining an interface needing to be tested according to the calling relation graph and the code modification information, and evaluating a test range according to the interface needing to be tested; and calculating a difficulty coefficient for an interface needing to be tested, and evaluating the test time according to the difficulty coefficient. Compared with the prior art, the accuracy of the obtained calling relation data does not need to depend on whether