Manufacturing method of flash memory device
The invention provides a manufacturing method of a flash memory device, which comprises the following steps of: removing a control gate layer exposed by an opening through a first etching process, and at the moment, forming a bulge at a vertex angle, close to a first side wall, of the control gate l...
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Main Authors | , , |
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Format | Patent |
Language | Chinese English |
Published |
17.03.2023
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Subjects | |
Online Access | Get full text |
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Summary: | The invention provides a manufacturing method of a flash memory device, which comprises the following steps of: removing a control gate layer exposed by an opening through a first etching process, and at the moment, forming a bulge at a vertex angle, close to a first side wall, of the control gate layer; removing the interlayer dielectric layer exposed by the protrusions and the openings through a second etching process, so as to enable the junction of the surface of the first side wall and the side wall of the control gate layer to be straight; forming a second side wall covering the surface of the first side wall and the side wall of the control gate layer; removing the floating gate layer exposed by the opening, and forming a word line in the opening; and removing the hard mask layer and the control gate layer, the interlayer dielectric layer and the floating gate layer below the hard mask layer to form a control gate and a floating gate. The protrusions formed in the first etching process are removed thro |
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Bibliography: | Application Number: CN202211579332 |