Ionization chamber structure optimization method, ionization chamber and measuring device

• Main Authors: YANG XIAOJUN, QU YANTAO, LIU CHANG, YUE WEIHONG, ZHU WENHUI
• Format: Patent
• Language: Chinese; English
• Published: 24.02.2023
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; MEASUREMENT OF NUCLEAR OR X-RADIATION; MEASURING; PHYSICS; TESTING

The invention discloses a structure optimization method of an ionization chamber, the ionization chamber and a measuring device, and the optimization method comprises the steps: constructing a finite element model of the ionization chamber, carrying out finite element multi-physical field analysis based on the finite element model, and adjusting the structure parameters of the ionization chamber according to each physical field analysis until the uniformity of the physical field meets a preset condition. And determining the structure of the ionization chamber according to the adjusted parameters. According to the invention, the structure parameters of the ionization chamber are optimized through finite element multi-physical field analysis, the uniformity of multiple physical fields is improved, and the detection efficiency of the ionization chamber is improved. 本申请公开了一种电离室的结构优化方法、电离室及测量装置，其中，优化方法包括构建电离室的有限元模型，基于有限元模型进行有限元多物理场分析，根据每个物理场分析调节电离室的结构参数，直至物理场的均匀性满足预设条件，根据调节后的参数确定电离室的结构。本申请通过有限元多物理场分析优化电离室的结构参数，提高了