Photoionization detector and method for gas sample analysis

• Main Author: GAMACHE YVES
• Format: Patent
• Language: Chinese; English
• Published: 14.02.2023
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

Disclosed is a photoionization detector (PID) comprising: an ionization chamber configured to enable a flow of a gas sample therethrough, the ionization chamber defining an ionization region and a detection region; a photoionization source configured to generate ionizing radiation for irradiating the flow of gas sample in the ionization region; an electric field ionization source configured to apply an ionization electric field inside the ionization chamber to intersect a flow of the gas sample in the ionization region, the ionization radiation and the ionization electric field configured to ionize the gas sample; and an ion detector configured to detect an ionization current generated by the ionized gas sample in a detection region. The PID may also include an optical window made, for example, from a window material including sapphire, and configured such that at least a portion of the ionizing radiation can pass through the optical window before entering the ionizing region. 公开了一种光电离检测器(PID)，该光电离检测器包括：电离室，该