SYSTEM AND METHOD FOR CONTROLLING IMAGE CONTRAST IN AN X-RAY SYSTEM
An X-ray inspection system for scanning an object and providing respective contrast controlled scan images is provided. The system comprises: an X-ray source configured to generate an X-ray beam for illuminating the object wherein the X-ray source is coupled with at least a first beam filter having...
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Main Author | |
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Format | Patent |
Language | Chinese English |
Published |
03.02.2023
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Subjects | |
Online Access | Get full text |
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Summary: | An X-ray inspection system for scanning an object and providing respective contrast controlled scan images is provided. The system comprises: an X-ray source configured to generate an X-ray beam for illuminating the object wherein the X-ray source is coupled with at least a first beam filter having a first thickness and a second beam filter having a second thickness, the second thickness being greater than the first thickness; a detector array; a processing unit; a user interface configured to receive a user input indicative of a desired contrast level in the image; and a controller configured to adjust a position of at least one of the first or second beam filters based on a user input indicative of a desired contrast level in the at least one image.
提供了一种用于扫描对象并提供相应对比度受控扫描图像的X射线检查系统。该系统包括:X射线源,被配置成生成用于照射该对象的X射线束,其中,该X射线源至少与具有第一厚度的第一光束滤波器和具有第二厚度的第二光束滤波器耦合,第二厚度大于第一厚度;检测器阵列;处理单元;用户界面,被配置成接收指示图像中期望对比度等级的用户输入;以及控制器,被配置为基于指示至少一个图像中的期望对比度等级的用户输入来调整第一或第二光束滤波器中的至少一个滤波器的位置。 |
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Bibliography: | Application Number: CN202080101575 |