Memory leak detection method and electronic equipment

• Main Authors: CHEN ZHONGLING, LU SHANGYE, WANG AOFEI
• Format: Patent
• Language: Chinese; English
• Published: 03.02.2023
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS

The embodiment of the invention provides a memory leak detection method and electronic equipment, relates to the technical field of terminals, and can accurately detect the memory leak problem of an application in the electronic equipment. The electronic equipment comprises a first process and a second process. The method comprises the following steps: acquiring first memory information corresponding to the first process and second memory information corresponding to the second process; determining that the first process meets a preset condition and the second process does not meet the preset condition according to the first memory information corresponding to the first process and the second memory information corresponding to the second process; acquiring third memory information corresponding to the first process; and according to the third memory information corresponding to the first process, judging whether memory leakage exists in the first process or not. 本申请实施例提供一种内存泄漏的检测方法及电子设备，涉及终端技术领域，可以准确的检测出电子设备