SSD testing device, system and method supporting multiple interface protocols

• Main Authors: FU WENMING, CHEN YUFENG, LEI YANZHOU, XIONG CHENGYAN, SHEN LI, LUO HENGYI
• Format: Patent
• Language: Chinese; English
• Published: 03.02.2023
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS

The invention discloses an SSD test device, system and method supporting multiple interface protocols, and the device comprises a first test tool which is used for accessing a first SSD, and the first SSD comprises an SATA interface; the second test fixture is used for accessing a second SSD, and the second SSD comprises a PCIE (Peripheral Component Interconnect Express) interface; test software used for testing the first SSD and the second SSD is arranged in the test assembly; and the patch cord assembly comprises a first patch cord and a second patch cord, the first patch cord is connected with the test assembly and the first test fixture, and the second patch cord is connected with the test assembly and the second test fixture. The test fixture can be compatible with different types of product tests, the capital investment and maintenance cost of the equipment and the test fixture are reduced, the scheduling of different types of products is facilitated, the utilization rate of the equipment and the test c