System and method for testing working parameters of three-dimensional laser imager
The invention discloses a system and a method for testing working parameters of a three-dimensional laser imager, which can more perfectly and quantitatively test the working parameters of the three-dimensional laser imager at multiple angles and more comprehensively evaluate the working performance...
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Main Authors | , |
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Format | Patent |
Language | Chinese English |
Published |
03.02.2023
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Subjects | |
Online Access | Get full text |
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Summary: | The invention discloses a system and a method for testing working parameters of a three-dimensional laser imager, which can more perfectly and quantitatively test the working parameters of the three-dimensional laser imager at multiple angles and more comprehensively evaluate the working performance of three-dimensional laser imaging. The device comprises a high-precision linear guide rail (1), a graphic card switching device (2), a multi-axis movement device (3), a light source (4), a graphic card (5) and a displacement sensor (6), the number of the light sources (4) is two, and the light sources (4) are symmetrically installed on the two sides of the graphic card switching device (2). The multi-axis movement device (3) realizes multi-degree-of-freedom movement; the graphic card switching device (2) is provided with a plurality of card slots so as to install different types of graphic cards; the displacement sensor (6) comprises two long-distance sensors and four short-distance sensors, and the two long-dist |
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Bibliography: | Application Number: CN202211321472 |