System-on-chip chip testing method and system, medium and computing equipment

• Main Authors: WU HUAPING, LIN SHUIYANG, YANG XIAO, SONG YING
• Format: Patent
• Language: Chinese; English
• Published: 03.02.2023
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention discloses a test method and system for a chip of a system on chip, a medium and computing equipment. The test method comprises the following steps: acquiring target measurement software matched with a loaded tested chip and expected data corresponding to the target measurement software from a pre-constructed measurement software library; when a function measurement starting instruction is received, target measurement software is recorded to the tested chip, so that the tested chip runs the target measurement software to obtain test data and an output signal, and the test data and the output signal are fed back; wherein the signal type of the output signal comprises a success type and a failure type; when the test data and the output signal are received, comparing the test data with the expected data to obtain a comparison result; and determining the comparison result and the target signal type of the output signal as a test result of the tested chip. According to the method and the device, measu