Internal and external parameter calibration method and device and electronic equipment
The embodiment of the invention provides an internal and external parameter calibration method and device and electronic equipment, and relates to the technical field of sensor calibration. The method comprises the following steps: acquiring an environment point cloud and an environment image corres...
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Main Authors | , , |
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Format | Patent |
Language | Chinese English |
Published |
31.01.2023
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Subjects | |
Online Access | Get full text |
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Summary: | The embodiment of the invention provides an internal and external parameter calibration method and device and electronic equipment, and relates to the technical field of sensor calibration. The method comprises the following steps: acquiring an environment point cloud and an environment image corresponding to the same environment; according to the initial external parameters, angle mapping, edge feature extraction and reverse mapping are carried out on the environment point cloud, a target edge point cloud in the environment point cloud is obtained, and the mapped space is a target space with a pitch angle and an azimuth angle in a camera coordinate system of the camera as orthogonal axes; according to the initial internal reference, angle mapping, edge feature extraction and reverse mapping are carried out on the environment image, target edge pixel points in the environment image are obtained, and the space to which the environment image is mapped is a target space; and iteratively updating the initial inte |
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Bibliography: | Application Number: CN202211281195 |