Chip testing method and chip testing device based on GRPC and storage medium

• Main Authors: SHI ZUHUA, PENG YUFENG, XIE ZELIANG, YUAN LIGANG, MA HUICHUANG
• Format: Patent
• Language: Chinese; English
• Published: 03.01.2023
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The embodiment of the invention provides a chip testing method based on GRPC, a chip testing device and a storage medium. The chip testing method based on the GRPC comprises the following steps: determining the number of to-be-tested chips which actually need to be tested in the to-be-tested chips, and sending out a corresponding number of instrument remote calling requests according to the number of the to-be-tested chips which actually need to be tested; based on a GRPC protocol, obtaining remote calling requests of all instruments; and sorting all the instrument remote call requests to form a request execution sequence table, and controlling the test instrument to sequentially test each to-be-tested chip which actually needs to be tested according to the request execution sequence table. According to the embodiment of the invention, the technical problem of low chip testing efficiency in the prior art is solved. 本申请实施例提供了一种基于GRPC的芯片测试方法、芯片测试装置及存储介质。该基于GRPC的芯片测试方法包括：确定待测芯片中实际需要测试的待测芯片的数量，根据实际需要测试的待测芯片的数量发出对