Test circuit and test method of switching device

• Main Authors: GAO CHONG, CHEN LONGLONG, LI PENGZHI, WANG GAOYONG, WANG XIUHUAN
• Format: Patent
• Language: Chinese; English
• Published: 16.12.2022
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

According to the test circuit and the test method of the switching device, the switching device is controlled to be switched on and switched off alternately, when the switching device is switched off, the test current of the direct current source is led into the grounding end by controlling the switching state of the switching circuit, and the test current of the direct current source is led into the grounding end under the condition that the direct current source is not switched off. Carrying out chopping control on the direct current source, and applying a half-wave test voltage to two ends of the switching device so as to carry out a voltage stress test on the switching device; when the switching device is switched on, testing current of the direct current source flows through the switching device by controlling the switching state of the switching circuit, and testing voltage output by the resonance alternating current voltage source is released by an internal follow current circuit, so that current stres