Metrology collection based on device characteristic information

• Main Authors: PAI RAGHURAM MAPOOR, OTEMARECA, LILLANTH, M, GADDE, VIJAY, KUMAR, LAKSHMIKANTHI, HARSHA, SANKAR, SRI, RAM, MARSHALL JEFFREY S, VIJAYENPANNINI, SHASHANKAR
• Format: Patent
• Language: Chinese; English
• Published: 13.12.2022
• Subjects: ELECTRIC COMMUNICATION TECHNIQUE; ELECTRICITY; SELECTING; TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION

The invention relates to metric collection based on device characteristic information. A method includes determining, by a controller device managing a plurality of network devices, device characteristic information for a network device of the plurality of network devices, and selecting, by the controller device, one or more sensors from a plurality of sensors based on the device characteristic information for the network device. The method further includes outputting, by the controller device, instructions that cause the network device to generate one or more selected sensors at the network device, and receiving, by the controller device, sensor information from the one or more selected sensors generated at the network device. 本公开涉及基于设备特性信息的度量收集。一种方法包括由管理多个网络设备的控制器设备确定多个网络设备中的一个网络设备的设备特性信息，并且由控制器设备基于网络设备的设备特性信息从多个传感器中选择一个或多个传感器。该方法还包括由控制器设备输出使得网络设备在网络设备处生成一个或多个选定传感器的指令，并且由控制器设备从在网络设备处生成的一个或多个选定传感器接收传感器信息。