All-optical microwave electric field near-field imaging device and method

• Main Authors: ZHANG ZUANXIAN, ZHANG XINDING, LI TENGCHAO, LIAO KAIYU
• Format: Patent
• Language: Chinese; English
• Published: 29.11.2022
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention relates to an all-optical microwave electric field near-field imaging device which comprises an atom sensing air chamber, a microwave source, a microwave element to be measured, a two-dimensional electric translation table, a dichroic mirror and a CCD camera. The output end of the microwave source is connected with the input end of a microwave element to be detected, the microwave element to be detected is fixed on the two-dimensional electric moving platform, the atom sensing gas chamber is located at the top of the microwave element to be detected, and detection light and coupling light which resonate with an atomic energy level are reversely and collinearly propagated and are respectively fed into the atom sensing gas chamber from the front side and the rear side of the atom sensing gas chamber; after the detection light beam is split from the coupling light through the dichroic mirror, the two-dimensional absorption imaging result is displayed on the CCD camera. Compared with the prior art,