Satellite ionization total dose analytical analysis method based on oblique incidence

• Main Authors: WANG JINGYAN, YAO SHUAI, QIN SHANSHAN, HU YANQI, QU SHAOJIE, ZHANG ZHIPING, CAI ZHENBO, ZHENG YUZHAN, XIANG HONGWEN, LI YANCUN, WANG LUYUAN
• Format: Patent
• Language: Chinese; English
• Published: 25.11.2022
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS

According to the satellite ionization total dose analytical analysis method based on oblique incidence, the effects of shielding thickness increasing and total dose decreasing caused by oblique incidence are considered, and ionization total dose data are remarkably reduced. The method specifically comprises the following steps: step 1, analyzing a relation between a satellite ionization total dose and an equivalent shielding thickness under a vertical incidence condition according to a satellite orbit parameter; step 2, acquiring a fitting formula and a fitting coefficient of the relationship between the satellite ionization total dose and the equivalent shielding aluminum thickness under the vertical incidence condition according to the relationship between the satellite ionization total dose and the equivalent shielding aluminum thickness under the vertical incidence condition; 3, analyzing a calculation formula of the total ionization dose of the satellite and the equivalent aluminum shielding thickness un