X-ray analysis device and method

• Main Authors: HONG FENG, CHEN ZHIJUN, GONG ZHIFENG, ZHANG XUENA, ZHANG BEI
• Format: Patent
• Language: Chinese; English
• Published: 25.11.2022
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

The invention is suitable for the technical field of X-ray analysis, and provides an X-ray analysis device and method. The X-ray analysis device comprises a light generation assembly, a capillary lens and a detection assembly which are sequentially arranged in the light propagation direction, the light generation assembly comprises an X-ray source and a visible light source, the X-ray source is used for emitting X-rays, and the visible light source is used for emitting visible light; the capillary lens comprises a lens main body and an optical fiber arranged in the lens main body, the lens main body is used for converging or parallelly outputting X-rays, and the optical fiber is used for converging or parallelly outputting visible light; the detection assembly comprises a visible light and X-ray detection device, the visible light detection device is used for observing whether visible light irradiates a to-be-detected point of the sample, and the X-ray detection device is used for receiving a signal sent afte