Measurement device, measurement method, and program

• Main Author: MURAKI YOSUKE
• Format: Patent
• Language: Chinese; English
• Published: 11.11.2022
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

According to one aspect of the invention, a measuring device is provided. The measuring device includes a guide light source portion, an imaging portion, and a measuring portion. The guide light source unit is configured to output guide light and continuously irradiate the measurement surfaces of the plurality of measurement reference points with the guide light. The measurement reference point is one end of the distance between two points of the measurement surface. The image capturing unit is disposed so as to capture an image of a light spot of the guide light on the measurement surface of the first measurement reference point. The measurement unit is disposed so as to calculate the inclination of the measurement surface on the basis of the shape of the captured light spot, and so as to calculate the depth of a second measurement reference point corresponding to the next number of times of the first measurement reference point on the basis of the inclination. 根据本发明的一个方面，提供一种测量装置。所述测量装置包括引导光源部，拍摄部，以及测量部。引导光