Startup and shutdown impact automatic testing device and system

• Main Authors: LI DEHONG, LUO LIGANG, XIANG HONGYUAN, ZHOU JUN, YANG XIANJIANG, PENG JUN
• Format: Patent
• Language: Chinese; English
• Published: 11.11.2022
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention mainly relates to the field of reliability testing of electronic products, and provides an automatic testing device and system for startup and shutdown impact in order to solve the problems that the startup and shutdown impact testing of the electronic products needs manual testing, time consumption is large and efficiency is low. The device comprises an AC input, an AC-DC power supply module, a single-chip microcomputer, a TTL serial port, a USB port module and a bidirectional silicon controlled rectifier control module. The AC-DC power supply module, the TTL serial port and the USB port module are respectively connected with the single-chip microcomputer, the single-chip microcomputer is connected with a tested electronic device through the TTL serial port during startup and shutdown testing, the single-chip microcomputer controls power on and power off of the tested electronic device through the bidirectional silicon controlled rectifier control module, the tested electronic device is started