Device for artificial weathering comprising two light emission sources
A method for measuring a sample (3; 23) for testing the artificial weathering or light resistance of a substrate (10; 20), comprising a weathering chamber (1; 21) arranged in the weathering chamber (1; 21), a first light source (4.1; 24.1), a first light source (4.1; 24.1) comprising one or more flu...
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Main Authors | , , |
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Format | Patent |
Language | Chinese English |
Published |
04.11.2022
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Subjects | |
Online Access | Get full text |
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Summary: | A method for measuring a sample (3; 23) for testing the artificial weathering or light resistance of a substrate (10; 20), comprising a weathering chamber (1; 21) arranged in the weathering chamber (1; 21), a first light source (4.1; 24.1), a first light source (4.1; 24.1) comprising one or more fluorescent ultraviolet lamps, each comprising an emission spectrum having a maximum wavelength lower than the predetermined wavelength, and a second light source (4.2; 24.2), a second light source (4.2; 24.2) comprises one or more light emitting diodes (4.2; 24.2), each light emitting diode comprising an emission spectrum having a maximum wavelength higher than a predetermined wavelength.
一种用于样品(3;23)的人工风化或耐光性测试的装置(10;20),包括风化室(1;21),设置在风化室(1;21)中的第一光源(4.1;24.1),第一光源(4.1;24.1)包括一个或多个荧光紫外灯,每个荧光紫外灯包括最大波长低于预定波长的发射光谱,以及设置在风化室(1,21)中的第二光源(4.2;24.2),第二光源(4.2;24.2)包括一个或多个发光二极管(4.2;24.2),每个发光二极管包括最大波长高于预定波长的发射光谱。 |
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Bibliography: | Application Number: CN202210478150 |