Abnormality determination device

• Main Author: HADA KEITA
• Format: Patent
• Language: Chinese; English
• Published: 01.11.2022
• Subjects: CONTROL OR REGULATING SYSTEMS IN GENERAL; CONTROLLING; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS; PHYSICS; REGULATING

Provided is an abnormality determination device capable of accurately performing abnormality determination even when data having different ambient temperatures are mixed. An abnormality determination device (10) is provided with: a normal data storage unit (113); a diagnostic data storage unit (114); a correction value derivation unit (105) that finds a feature quantity for each ambient temperature for the normal data, and derives a statistical quantity obtained from the feature quantity as a correction value; a correction value interpolation unit (104) that uses the correction values at the at least two ambient temperatures to calculate, by interpolation, a correction value at the ambient temperature when the diagnostic data is acquired; a normal data correction unit (103) that corrects the feature amount of the normal data using the correction value; a learning unit (242) that learns the feature amount of the corrected normal data as learning data and constructs a learning model; a diagnostic data correctio