Secondary pollutant source analysis method and device and electronic equipment

• Main Authors: WU JIANBIN, QIN DONGMING, CHEN HUANSHENG, WANG QIAN, CHAI YUAN, ZHONG FANGQIAN, XIAO LINHONG, WANG WENDING
• Format: Patent
• Language: Chinese; English
• Published: 01.11.2022
• Subjects: CALCULATING; COMPUTING; COUNTING; DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES; PHYSICS; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR

The invention provides a secondary pollutant source analysis method and device and electronic equipment, and belongs to the field of source analysis. The method comprises: determining a concentration contribution of a target source class of a target region to a target secondary pollutant of an acceptor point using an air quality model; obtaining an emission list and source spectrum data of each sub-region of the target region; for each sub-region, according to the emission list and the source spectrum data of the sub-region, determining the generation potential of a target secondary pollutant corresponding to each sub-source class of the target source classes in the sub-region; determining the generation weight of each sub-source class of each sub-region according to the generation potential of the target secondary pollutant corresponding to each sub-source class in each sub-region; and determining the concentration contribution of each sub-source class of each sub-region to the target secondary pollutant of