Device and method for measuring refractive index of low-temperature infrared material based on single-point detection

• Main Authors: NI LEI, JIANG DONGXU, YANG YINGHONG, LIAO XUAN, YU JIAXIN, XIANG BEIPING
• Format: Patent
• Language: Chinese; English
• Published: 01.11.2022
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention discloses a low-temperature infrared material refractive index measuring device and method based on single-point detection, and relates to the technical field of optical measurement, and the technical scheme is characterized in that the low-temperature infrared material refractive index measuring device comprises an infrared light source assembly used for outputting infrared light; the rotating table is arranged in the vacuum thermostat and is used for adjusting the rotating angle of the test prism; the infrared light passes through the spectroscope and then is transmitted to the test prism, and the spectroscope reflects and outputs the light which is reflected by the reflecting film on the back surface of the test prism and returns along the original path; the aiming device is used for acquiring a signal amplitude changing along with the rotation angle of the test prism through a single-point detector; and the processor is used for calculating the deviation angle of the test prism after the rot